Power Device Dynamic Test Systems
Dynamic parameter test systems are specialized equipment for evaluating the switching performance of IGBT and SiC power devices. These systems perform single pulse, double pulse, and multi-pulse tests to characterize device behavior under various operating conditions.
| Model | Test Voltage | Test Current (Peak) |
|---|---|---|
| QTJT-D | 10~1700V/10~6500V | 20~6000A(10000A,10μs) |
| QTJ8600T | ||
| QTJ15610A |
Test Capabilities
Modern power device test systems offer comprehensive testing capabilities:
- Single and double pulse testing for switching loss characterization
- Multi-pulse and periodic pulse testing for thermal behavior
- Short circuit testing for device robustness evaluation
- Gate charge (Qg) measurement
- Kelvin connection testing for accurate measurements
- UIS (Unclamped Inductive Switching) testing
- Wafer-level to module-level testing capability
Production Line Testing
Production line test systems provide automated testing solutions for power semiconductor manufacturing. These systems support wafer-level, chip-level, discrete device, and module-level testing with ISO, DC, AC, and other test modes. The systems feature automated test sequences, rich test interfaces, and configurable function modules to meet various device testing requirements.
Pulse Signal Generators
Pulse signal generators are professional instruments for power device dynamic testing. They provide multiple pulse signal types including single pulse, double pulse, multi-pulse, periodic pulse, phase-shift full bridge, SPWM, and SVPWM modes. These generators can be used to build manual double-pulse test platforms or for power module inspection and maintenance.
